Evidence of a green luminescence band related to surface flaws in high purity silica glass

Optics Express

Volumn 18, Issue 21, 2010, Pages 21557-21566

  Fournier, J ^a,b   Neauport J ^a   Grua, P ^a   Fargin, E ^b   Jubera, V ^b   Talaga, D ^c   Jouannigot, S ^d  

^a CEA CESTA   (France)

^b UNIVERSITÉ DE BORDEAUX   (France)

^c INSTITUT DES SCIENCES MOLÉCULAIRES   (France)

^d Laboratoire des Composites Thermostructuraux   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL MICROSCOPY; INDENTATION; LASER DAMAGE; LASER EXCITATION; LUMINESCENCE; MAPS; SILICA; SURFACE DEFECTS;

DAMAGE MECHANISM; EXCITATION WAVELENGTH; GREEN LUMINESCENCE; HIGH PURITY; MACROSCOPIC SURFACES; POLISHED SURFACES; SILICA GLASS; SPATIAL DISTRIBUTION; SUB-SURFACES; SURFACE FLAW;

FUSED SILICA;

GLASS; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; CONFOCAL MICROSCOPY; FLUORESCENCE MICROSCOPY; LASER; LIGHT; LUMINESCENCE; METHODOLOGY; NORMAL DISTRIBUTION; OPTICS; RAMAN SPECTROMETRY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

GLASS; LASERS; LIGHT; LUMINESCENCE; MICROSCOPY, CONFOCAL; MICROSCOPY, ELECTRON, TRANSMISSION; MICROSCOPY, FLUORESCENCE; NORMAL DISTRIBUTION; OPTICS AND PHOTONICS; SILICON DIOXIDE; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 78049488488     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.021557     Document Type: Article

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