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Volumn 57, Issue 10, 1998, Pages 5674-5683
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Cathodoluminescence microcharacterization of the defect structure of irradiated hydrated and anhydrous fused silicon dioxide
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001704742
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.5674 Document Type: Article |
Times cited : (112)
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References (83)
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