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Volumn 57, Issue 10, 1998, Pages 5674-5683

Cathodoluminescence microcharacterization of the defect structure of irradiated hydrated and anhydrous fused silicon dioxide

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[No Author keywords available]

Indexed keywords


EID: 0001704742     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.5674     Document Type: Article
Times cited : (110)

References (83)
  • 60
    • 0000184877 scopus 로고
    • C. Itoh et. al Phys. Rev. B 39, 11 183 (1989).
    • (1989) Phys. Rev. B , vol.39 , pp. 11183
    • Itoh, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.