Multiple pulses laser irradiation study in silica: Comparison between 1064nm and 355nm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5250, Issue , 2004, Pages 182-187

  Natoli, J Y ^a   Bertussi, B ^a   Gallais, L ^a   Commandre M ^a   Amra, C ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Bulk and surface laser damage; Laser damage threshold; Localized study; Multiple pulses irradiation; Silica

Indexed keywords

CRYSTALLINE MATERIALS; CURVE FITTING; LASER PULSES; MATHEMATICAL MODELS; PROBABILITY; RELIABILITY; SILICA; STATISTICAL METHODS;

LASER DAMAGE THRESHOLD; PRECURSORS;

LASER BEAM EFFECTS;

EID: 1942438594     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.513377     Document Type: Conference Paper

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