Morphology and texture evolution of nanostructured CaF2 films on amorphous substrates under oblique incidence flux

Nanotechnology

Volumn 21, Issue 44, 2010, Pages

  Gaire, C ^a   Snow, P ^a   Chan, T L ^a   Yuan, W ^a   Riley, M ^a   Liu, Y ^a   Zhang, S B ^a   Wang, G C ^a   Lu, T M ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SUBSTRATE; BIAXIAL TEXTURES; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORY; INCIDENT ANGLES; NANO-STRUCTURED; OBLIQUE INCIDENCE; OUT-OF-PLANE ORIENTATION; OUT-OF-PLANE TEXTURES; SI SUBSTRATES; SUBSTRATE TEMPERATURE; SURFACE POLE FIGURE; TEXTURE EVOLUTIONS; TEXTURE FORMATION; X RAY POLE FIGURES;

ADSORPTION; CRYSTAL ORIENTATION; DENSITY FUNCTIONAL THEORY; HIGH ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; POLES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS FILMS;

EID: 77958558001     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/44/445701     Document Type: Article

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