SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 517, Issue 24, 2009, Pages 6623-6628

Biaxial CdTe/CaF2 films growth on amorphous surface

(9) Yuan, W a Tang, F a Li, H F a Parker, T a LiCausi, N b Lu, T M a Bhat, I b Wang, G C a Lee, S c

a Rensselaer Polytechnic Institute (United States)

b RENSSELAER POLYTECHNIC INSTITUTE (United States)

c Benet Laboratories (United States)

Author keywords

Cadmium telluride; Heterostructures; Interfaces; Metal organic chemical vapor deposition; Reflection high energy electron diffraction; Surface morphology; Transmission electron microscopy

Indexed keywords

AMORPHOUS SUBSTRATE; AMORPHOUS SURFACES; BIAXIAL TEXTURES; BIAXIALLY TEXTURED; CADMIUM TELLURIDE; CDTE; CRYSTALLINE ORIENTATIONS; HETEROSTRUCTURES; HIGH DENSITY; METALORGANIC CHEMICAL VAPOR DEPOSITION; NEAR-SURFACE; SURFACE POLE FIGURE; TEM; TWIN FAULTS; X-RAY POLE FIGURE ANALYSIS;

AMORPHOUS FILMS; CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CRYSTALS; ELECTRON DIFFRACTION; ELECTRONS; HIGH ENERGY PHYSICS; INDUSTRIAL CHEMICALS; METAL ANALYSIS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; NANORODS; ORGANIC CHEMICALS; ORGANOMETALLICS; POLES; REFLECTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; TELLURIUM COMPOUNDS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY;

SURFACE MORPHOLOGY;

EID: 71749083880 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2009.04.052 Document Type: Article

Times cited : (19)

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