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Journal of Applied Physics

Volumn 108, Issue 7, 2010, Pages

Nanometric multiscale rough Zn-ZnO superhydrophobic thin films: Self-diffusion of zinc and effect of UV irradiation

(4) Barshilia, Harish C a Tej, K R Sai a Devi, L Mayura a Rajam, K S a

a SURFACE ENGINEERING DIVISION (India)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AIR POCKETS; AIR-GAPS; AMBIENT CONDITIONS; CHEMICAL CHANGE; COATING SURFACE; EXPERIMENTAL EVIDENCE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MICRO RAMAN SPECTROSCOPY; MICRON SCALE; MORPHOLOGICAL CHANGES; MULTI SCALE ROUGHNESS; MULTISCALES; NANOMETRIC RANGES; NANOMETRICS; OPTIMUM COMBINATION; OPTIMUM DENSITY; OUTWARD DIFFUSION; SELF-DIFFUSION; SUPERHYDROPHOBIC; SUPERHYDROPHOBICITY; TEXTURED SURFACE; THERMAL OXIDATION; UV IRRADIATION; ZNO; ZNO NANOCRYSTAL; ZNO SURFACE;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIFFUSION; DIFFUSION COATINGS; HYDROPHOBICITY; IRRADIATION; MORPHOLOGY; NANOCLUSTERS; OXIDATION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ZINC; ZINC OXIDE;

SURFACE ROUGHNESS;

EID: 77958187766 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3487925 Document Type: Article

Times cited : (18)

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