Optical coatings with enhanced roughness for ultrahydrophobic, low-scatter applications

Applied Optics

Volumn 41, Issue 16, 2002, Pages 3294-3298

  Duparré, Angela ^a   Flemming, Marcel ^a   Steinert, Jörg ^a   Reihs, Karsten ^b  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b SuNyx Surface Nanotechnologies GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036602879     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.003294     Document Type: Article

References (14)

1. E. Wolfram and R. Faust, Wetting, Spreading and Adhesion, J. F. Padday, ed. (Academic, London, 1978), p. 213.
2. M. Miwa, A. Nakajima, A. Fujishima, K. Hashimoto, and T. Watanabe, “Effects of the surface roughness on sliding angles of water droplets on superhydrophobic surfaces,” Langmuir 16, 5754-5760 (2000).
3. 3coating films with high transparency by the sol-gel method,” J. Am. Ceram. Soc. 80, 3213-3216 (1997).
4. M. Miwa, A. Nakajima, A. Fujishima, K. Hashimoto, and T. Watanabe, “Effects of the surface roughness on sliding angles of water droplets on superhydrophobic surfaces,” Langmuir 16, 5754-5760 (2000).
5. A. Nakajima, A. Fujishima, K. Hashimoto, and T. Watanabe, “Preparation of transparent superhydrophobic boehmite and silicia films by sublimation of aluminium acetylacetonate,” Adv. Mater. 11, 1365-1368 (1999).
6. K. Ogawa, M. Soga, Y. Takada, and I. Nakayama, “Development of a transparent and ultrahydrophobic glass plate,” Jpn. J. Appl. Phys. Part 2 32, L614-L615 (1993).
7. A. Duparre, J. Ferre-Borrull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining rms roughness and power spectral densities of optical components,” Appl. Opt. 41, 154-171 (2002).
8. C. Ruppe and A. Duparre, “Roughness analysis of optical films and substrates by atomic force microscopy,” Thin Solid Films 288, 8-13 (1996).
9. A. Duparre and G. Notni, “Multi-type surface and thin film characterization using light scattering, scanning force microscopy and white light interferometry,” in Optical Metrology, G. A. Al-Jumaily ed., Vol. CR 72 of SPIE Critical Review Paper Series (SPIE, Bellingham, Wash., 1999), pp. 213-231.
10. A. W. Adamson, Physical Chemistry of Surfaces, 5th ed. (Wiley, New York, 1990).
11. J. Ferre-Borrull, A. Duparre, and E. Quesnel, “Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm,” Appl. Opt. 39, 5854-5864 (2000).
12. A. Duparre, “Light scattering of thin dielectric films”, in Thin Films for Optical Coatings, R. E. Hummel and K. H. Guenther, eds., Vol. 1 of Handbook of Optical Properties Series (CRC, Boca Raton, Fla., 1995), pp. 273-304.
13. P. Bousquet, F. Flory, and P. Roche, “Scattering from multilayer thin films: theory and experiment,” J. Opt. Soc. Am. 71, 1115-1123 (1981).
14. P. Kappen, K. Reihs, C. Seidel, M. Voetz, and H. Fuchs, “Overlayer thickness determination by anglar dependent x-ray photoelectron specroskopy (ADXPS) of rough surfaces with a spherical topography,” Surf. Sci. 465, 40-50 (2000).