Residual-based localization and quantification of peaks in x-ray diffractograms

Annals of Applied Statistics

Volumn 2, Issue 3, 2008, Pages 861-886

  Davies, P L ^a   Gather, U ^a   Meise, M ^a   Mergel, D ^a   Mildenberger, T ^a  

^a NONE

Author keywords

Confidence regions; Nonparametric regression; Peak detection; Thin film physics; X ray diffractometry

Indexed keywords

EID: 77958096422     PISSN: 19326157     EISSN: 19417330     Source Type: Journal    
DOI: 10.1214/08-AOAS181     Document Type: Article

References (24)

1. Benjamini, Y. and Hochberg, Y. (1995). Controlling the false discovery rate: A practical and powerful approach to multiple testing. J. Roy. Statist. Soc. Ser. B 57 289-300.
2. Bernholt, T. and Hofmeister, T. (2006). An algorithm for a generalized maximum subsequence problem. In LATIN 2006: Theoretical Informatics (J. Correa, A. Hevia and M. Kiwi, eds.). Lecture Notes in Comput. Sci. 3887 178-189. Springer, Berlin.
3. Birkholz, M. (2006). Thin Film Analysis by X-Ray Scattering. Wiley-VCH, Weinheim.
4. Davies, P. and Kovac, A. (2001). Local extremes, runs, strings and multiresolution (with discussion). Ann. Statist. 29 1-65.
5. Davies, P. L. (1995). Data features. Statist. Neerlandica 49 185-245.
6. Davies, P. L. (2006). Long range financial data and model choice. Technical Report 21/06, Collaborative Research Centre 475, Dept. Statistics, Univ. Dortmund.
7. Davies, P. L., Kovac, A. and Meise, M. (2008). Nonparametric regression, confidence regions and regularization. Ann. Statist. To appear. Ar Xiv:0711.0690 [math.ST].
8. Davies, P. L. and Meise, M. (2008). Approximating data with weighted smoothing splines. J. Nonparametr. Statist. 20 207-228.
9. Dümbgen, L. (2003). Optimal confidence bands for shape-restricted curves. Bernoulli 9 423-449.
10. Dümbgen, L. (2007). Confidence bands for convex median curves using sign-tests. In Asymptotics: Particles, Processes and Inverse Problems (E. Cator, G. Jongbloed, C. Kraaikamp, R. Lopuhaä and J. Wellner, eds.). IMS Lecture Notes-Monograph Series 55 85-100. IMS, Beachwood, OH.
11. Dümbgen, L. and Johns, R. (2004). Confidence bands for isotonic median curves using sign-tests. J. Comput. Graph. Statist. 13 519-533.
12. Dümbgen, L. and Spokoiny, V. (2001). Multiscale testing of qualitative hypotheses. Ann. Statist. 29 124-152.
13. Fletcher, R. (2000). Practical Methods of Optimization, 2nd ed. Wiley, Chichester.
14. Hall, Jr., M.M., Veeraraghavan, V. G., Rubin, H. and Winchell, P. G. (1977). The approximation of symmetric x-ray peaks by Pearson type vii distributions. J. Appl. Crystallography 10 66-68.
15. Johnson, N., Kotz, S. and Balakrishnan, N. (1995). Continuous Univariate Distributions. 2, 2nd ed. Wiley, New York.
16. Jupp, D. (1978). Approximation to data by splines with free knots. SIAM J. Numer. Anal. 15 328-343.
17. Kabluchko, Z. (2007). Extreme-value analysis of standardized Gaussian increments. arXiv:0706.1849v2 [math.PR].
18. Li, K.-C. (1989). Honest confidence regions for nonparametric regression. Ann. Statist. 17 1001-1008.
19. Mergel, D. (2006). Thin films of ITO as transparent elextrodes. Vakuum in Forschung und Praxis 18 15-18.
20. Mergel, D. and Qiao, Z. (2004). Correlation of lattice distortion with optical and electrical properties of In2O3:Sn films. J. Appl. Phys. 95 5608-5615.
21. Mergel, D., Stass, W., Ehl, G. and Barthel, D. (2000). Oxygen incorporation in thin films of In2O3:Sn prepared by radio frequency sputtering. J. Appl. Phys. 88 2437-2442.
22. Mergel, D., Thiele, T. and Qiao, Z. (2005). Texture analysis of thin In2O3:Sn films prepared by direct-current and radio-frequency magnetron-sputtering. J. Materials Research 20 2503-2509.
23. Mildenberger, T. (2008). A geometric interpretation of the multiresolution criterion in nonparametric regression. J. Nonparametr. Statist. 20 599-609.
24. Smart, L. and Moore, E. (2001). Solid State Chemistry-An Introduction. Nelson Thornes Ltd., Cheltenham, United Kingdom.