CMOS pixel sensor response to low energy electrons in transmission electron microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 605, Issue 3, 2009, Pages 350-352

  Battaglia, Marco ^a,b   Contarato, Devis ^b   Denes, Peter ^b   Doering, Dionisio ^b   Radmilovic, Velimir ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Monolithic active pixel sensor; Transmission electron microscopy

Indexed keywords

CHARGE COLLECTION; CMOS SENSORS; LOW ENERGY ELECTRONS; MONOLITHIC ACTIVE PIXEL SENSOR; PIXEL CELLS; PIXEL SENSORS; POINT-SPREAD FUNCTION; RADIATION TOLERANT;

ELECTRON MICROSCOPES; ELECTRONS; IMAGE SENSORS; OPTICAL TRANSFER FUNCTION; TRANSMISSION ELECTRON MICROSCOPY;

PIXELS;

EID: 67649389482     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.03.249     Document Type: Article

References (9)

1. Cosslett V.E., et al. Nature 281 (1979) 49
2. Girit C.O., et al. Science 323 (2009) 1705
3. Meyer J.C., Kisielowski C., Erni R., Rossell M.D., Crommie M.F., and Zettl A. Nano Lett. 8 (2008) 3582
4. Battaglia M., et al. Nucl. Instr. and Meth. A 598 (2009) 642 (arXiv:0811.2833 [physics.ins-det])
5. Agostinelli S., et al. Nucl. Instr. and Meth. A 506 (2003) 250
6. S. Chauvie, G. Depaola, V. Ivanchenko, F. Longo, P. Nieminen, M.G. Pia, Prepared for CHEP'01: Computing in High-Energy Physics and Nuclear, Beijing, China, 3-7 September 2001.
7. Battaglia M. Nucl. Instr. and Meth. A 572 (2007) 274
8. Gaede F. Nucl. Instr. and Meth. A 559 (2006) 177
9. F. Gaede, T. Behnke, N. Graf, T. Johnson, in: Proceedings of the 2003 Conference for Computing in High-Energy and Nuclear Physics (CHEP 03), La Jolla, California, 24-28 March 2003, pp. TUKT001 (arXiv:physics/0306114).