Active Pixel Sensors for electron microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 579, Issue 2 SPEC. ISS., 2007, Pages 891-894

  Denes, P ^a   Bussat, J M ^a   Lee, Z ^a   Radmillovic, V ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Active Pixel Sensor; Electron microscopy

Indexed keywords

ELECTRON MICROSCOPY; OPTICAL TRANSFER FUNCTION; PARTICLE BEAM TRACKING; PARTICLE DETECTORS; PHOTOGRAPHY; PIXELS;

ACTIVE PIXEL SENSORS; CELL PHONE CAMERAS; LAWRENCE BERKELEY NATIONAL LABORATORY;

IMAGE SENSORS;

EID: 34547781282     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.05.308     Document Type: Article

References (16)

1. C.E. Nelson, et al., 2005, Unpublished results.
2. Zuo J. Microsc. Res. Tech. 49 (2000) 245
3. Stearns D.G., and Wiedwald J.D. Rev. Sci. Instrum. 60 6 (1989) 1095
4. Haider M., et al. Ultramicroscopy 54 (1994) 41
5. Fan G.Y., et al. Ultramicroscopy 70 (1998) 107
6. Faruqi A.R., et al. Nucl. Instr. and Meth. 513 (2003) 310
7. Wecklers G. IEEE J. Solid-State Circuits SC-2 (1967) 65
8. Noble P. IEEE Trans. Electron Dev. ED-15 (1968) 202
9. (appropriate ref.)
10. Simulation results in this paper are based on the methodology of D. C., Joy, (1995), Monte-Carlo Modeling for Electron Microscopy and Microanalysis, Oxford University Press, with relativistic corrections added by the author.
11. Meyer R., and Kirkland A. Ultramicroscopy 75 (1998) 22
12. Schroder D.K., et al. IEEE Trans. Electron Dev. ED-50 (2003) 906
13. 〈http://www.lbl.gov/LBL-Programs/TEAM/index.html〉.
14. Jarron, et al. Nucl. Phys. B 78 (1999) 625
15. Xuong, et al. Proc. SPIE 5301 (2004) 242
16. Faruqi, et al. Nucl. Instr. and Meth. A 546 (2005) 170