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Volumn 17, Issue 5, 2007, Pages 549-555

Electronic detectors for electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX FORMATION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRONIC SENSOR; IMAGING SYSTEM; LIGHT SCATTERING; MACROMOLECULE; PARAMETER; PRIORITY JOURNAL; RADIATION INJURY; REVIEW; SIGNAL NOISE RATIO; STRUCTURE ANALYSIS;

EID: 35549001684     PISSN: 0959440X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sbi.2007.08.014     Document Type: Review
Times cited : (105)

References (40)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.