Organic thin-film transistor memory with nanocrystal carbon dots

e-Journal of Surface Science and Nanotechnology

Volumn 8, Issue , 2010, Pages 250-253

  Tada, Yoshihiro ^a   Mohamad, Khairul A ^b   Uesugi, Katsuhiro ^a   Fukuda, Hisashi ^a  

^a MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITI MALAYSIA SABAH   (Malaysia)

Author keywords

Focused ion beam; Nanocrystal; Organic thin film transistor; Pentacene

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIAS VOLTAGE; CARBON; FIELD EFFECT TRANSISTORS; FOCUSED ION BEAMS; GALLIUM COMPOUNDS; INTERFACES (MATERIALS); IONS; NANOCRYSTALS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM CIRCUITS; THIN FILMS; THRESHOLD VOLTAGE;

CARBON SOURCE; CHANNEL REGION; FOCUSED ION BEAM TECHNIQUE; ORGANIC THIN FILM TRANSISTORS; PENTACENES; SCANNING ION MICROSCOPY; STRUCTURAL INFORMATION; THRESHOLD VOLTAGE SHIFTS;

THIN FILM TRANSISTORS;

EID: 77957869800     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2010.250     Document Type: Article

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