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Volumn 601, Issue 13, 2007, Pages 2769-2773
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Ordering of Ge nanocrystals using FIB nanolithography
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Author keywords
FIB lithography; Growth; MBE; Nanocrystal ordering; Nanostructures; Patterned substrate; SiGe; Unwetting
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Indexed keywords
CONTAMINATION;
FOCUSED ION BEAMS;
MOLECULAR BEAM EPITAXY;
NANOLITHOGRAPHY;
SEMICONDUCTING GERMANIUM;
SILICA;
FIB LITHOGRAPHY;
NANOCRYSTAL ORDERING;
PATTERNED SUBSTRATES;
NANOCRYSTALS;
LITHOGRAPHY;
SEMICONDUCTORS;
SILICA;
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EID: 34250791154
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2006.12.075 Document Type: Article |
Times cited : (24)
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References (13)
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