Minimize production loss in device testing via condition-based equipment maintenance

IEEE Transactions on Automation Science and Engineering

Volumn 7, Issue 4, 2010, Pages 958-963

  Jin, Tongdan ^a   Mechehoul, Mahmoud ^a  

^a Texas State University   (United States)

Author keywords

Condition based maintenance (CBM); electronics prognostics; nonstationary Gaussian process; remaining useful life

Indexed keywords

CONDITION-BASED MAINTENANCE; DEGRADATION MODEL; DEVICE TESTING; ELECTRONICS PROGNOSTICS; EQUIPMENT FAILURES; EQUIPMENT MAINTENANCE; MAINTENANCE POLICY; NONSTATIONARY GAUSSIAN PROCESS; NUMERICAL EXAMPLE; OPTIMIZATION ALGORITHMS; PRODUCTION LOSS; REMAINING USEFUL LIVES; TIME VARYING;

DEGRADATION; GAUSSIAN NOISE (ELECTRONIC); MAINTENANCE; PROGRAM DIAGNOSTICS;

GAUSSIAN DISTRIBUTION;

EID: 77957823948     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2010.2046164     Document Type: Article

References (24)

1. J. Rivoir, "Parallel test reduces cost of test more effectively than just a cheap tester", in Proc. IEEE/CPMT/SEMI 29th Int. Electron. Manuf. Technol. Symp., 2004, pp. 263-272.
2. C.-F. Chien and J.-Z. Wu, "Analyzing repair decisions in the site imbalance problem of semiconductor test machines", IEEE Trans. Semicond. Manuf., vol. 16, pp. 704-711, 2003.
3. X. Yao, E. Fernadez-Gaucherand, M. Fu, and S. Marcus, "Optimal preventive maintenance scheduling in semiconductor manufacturing", IEEE Trans. Semicond. Manuf., vol. 17, pp. 345-356, Aug. 2004.
4. P. H. Tag and M. T. Zhang, "eManufacturing in the semiconductor industry: A case study on intelligent preventive maintenance", IEEE Robot. Autom. Mag., pp. 25-32, Dec. 2006.
5. D. Babbs and R. Gaskins, "Effectof reduced equipment downtime variability on cycle time in a conventional 300 mm Fab", in Proc. IEEE/SEMI Adv. Semicond. Manuf. Conf., 2008, pp. 237-242.
6. M. J. Lopez and S. C. Wood, "Systems of multiple cluster tools: Configurations, reliability, and performance", IEEE Trans. Semicond. Manuf., vol. 16, pp. 170-178, 2003.
7. P. B. Luh, D. Yu, S. Soorapanth, A. Khibnik, and R. Rajamani, "A Lagrangian relaxation based approach to schedule asset overhaul and repair services", IEEE Trans. Autom. Sci. Eng., vol. 2, no. 2, pp. 145-157, 2005.
8. S. A. Mosley, T. Teyner, and R. M. Uzsoy, "Maintenance scheduling and staffing policies in a wafer fabrication facility", IEEE Trans. Semicond. Manuf., vol. 11, no. 2, pp. 316-323, 1998.
9. T. K. Das and S. Sarkar, "Optimal preventive maintenance in a production inventory system", IIE Trans. Qual. Reliab. Eng., vol. 31, no. 6, pp. 537-551, 1999.
10. H. Wang, "A survey of maintenance policies of deteriorating systems", Eur. J. Oper. Res., vol. 139, no. 3, pp. 469-489, 2002.
11. L. Lopez, "Advanced electronic prognostics through system telemetry and pattern recognition methods", Microelectron. Reliability, vol. 47, no. 12, pp. 1865-1873, 2007.
12. N. Vichare and M. Pecht, "Prognostics and health management of electronics", IEEE Trans. Compon. Packag. Technol., vol. 29, pp. 222-229, 2006.
13. W.-Y. Chang, T.-C. Wang, and Y.-P. Shin, "Real-time fault detection and condition monitoring system for chiller", in Proc. Semicond. Manuf. Technol. Workshop, 2004, pp. 160-165.
14. Y.-C. Su, F.-T. Cheng, M.-H. Hung, Y.-C. Lin, and R.-C. Lin, "Design and implementation of an intelligent prognostics system", in Proc. IEEE Int. Conf. Autom. Sci. Eng., 2005, pp. 273-278.
15. K. M. Goh, B. Tjahjono, T. Baines, and S. Subramaniam, "A review of research in manufacturing prognostics", in Proc. IEEE Int. Conf. Ind. Informat., 2006, pp. 417-422.
16. T. Jin and Y. Yu, "Production loss based maintenance with uncertain failure service times", in Proc. 2009 Int. Conf. Reliab., Maintainability, and Safety Symp., 2009, pp. 32-37.
17. N. Gebraeel, A. Elwany, and J. Pan, "Residual life predictions in the absence of prior degradation knowledge", IEEE Trans. Rel., vol. 58, pp. 106-117, 2009.
18. A. H. Christer and W. Wang, "A model of condition monitoring of a production plant", Int. J. Prod. Res., vol. 30, no. 9, pp. 2199-2211, 1992.
19. C. Lu and W. Meeker, "Using degradation measures to estimate a time-to-failure distribution", Technometrics, vol. 35, no. 2, pp. 161-174, 1993.
20. T. Jin, P. Wang, and Q. Huang, "A practical MTBF estimate for PCB design considering component and non-component failures", in Proc. Annu. Reliab. Maintainability Symp., 2006, pp. 604-610.
21. A. Urmanov, "Electronic prognostics for computer servers", in Proc. Reliab. Maintainability Symp., 2007, pp. 65-70.
22. C. Park and W. J. Padgett, "Stochastic degradation models with several accelerating variables", IEEE Trans. Rel., vol. 55, pp. 379-390, 2006.
23. W. J. Padgett and M. A. Tomlinson, "Inference from accelerated degradation and failure data based on Gaussian process models", Lifetime Data Anal., vol. 10, pp. 191-206, 2004.
24. D. Montgomery, Design and Analysis of Experiment, 7th ed. New York: Wiley, 2009, ch. 2, pp. 47-48.