Advanced electronic prognostics through system telemetry and pattern recognition methods

Microelectronics Reliability

Volumn 47, Issue 12, 2007, Pages 1865-1873

  Lopez, Leon ^a  

^a RAS Computer Analysis Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; PATTERN RECOGNITION; PROBABILITY DISTRIBUTIONS; SERVERS; TELEMETERING;

CONTINUOUS SYSTEM TELEMETRY HARNESS (CSTH); ELECTRONIC PROGNOSTICS (EP); HIGH-AVAILABILITY SYSTEMS;

MICROSYSTEMS;

EID: 35648992456     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.02.018     Document Type: Article

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