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Volumn 352, Issue 2, 2010, Pages 259-264
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Fine-tuning of catalytic tin nanoparticles by the reverse micelle method for direct deposition of silicon nanowires by a plasma-enhanced chemical vapour technique
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Author keywords
Catalytic tin nanoparticles; Fine tuning; Plasma enhanced chemical vapour deposition; Reverse micelle; Silicon nanowires
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Indexed keywords
FINE-TUNING;
PLASMA-ENHANCED CHEMICAL VAPOUR DEPOSITION;
REVERSE MICELLE;
SILICON NANOWIRES;
TIN NANOPARTICLES;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
BROMINE COMPOUNDS;
DYNAMIC LIGHT SCATTERING;
ENAMELS;
HEXANE;
MICELLES;
NANOPARTICLES;
NANOWIRES;
PLASMA DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASMAS;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
TITANIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
TUNING;
TIN;
CETRIMIDE;
NANOWIRE;
SILICON;
TIN;
AQUEOUS SOLUTION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
LIGHT SCATTERING;
NANOCATALYSIS;
PARTICLE SIZE;
PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION;
PRIORITY JOURNAL;
PROCESS DESIGN;
RAMAN SPECTROMETRY;
REPRODUCIBILITY;
REVERSE MICELLE;
TRANSMISSION ELECTRON MICROSCOPY;
CATALYSIS;
METAL NANOPARTICLES;
MICELLES;
NANOTECHNOLOGY;
NANOWIRES;
PARTICLE SIZE;
SILICON;
SURFACE PROPERTIES;
TIN;
VOLATILIZATION;
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EID: 77957757126
PISSN: 00219797
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcis.2010.08.085 Document Type: Article |
Times cited : (6)
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References (44)
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