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Volumn 352, Issue 2, 2010, Pages 259-264

Fine-tuning of catalytic tin nanoparticles by the reverse micelle method for direct deposition of silicon nanowires by a plasma-enhanced chemical vapour technique

Author keywords

Catalytic tin nanoparticles; Fine tuning; Plasma enhanced chemical vapour deposition; Reverse micelle; Silicon nanowires

Indexed keywords

FINE-TUNING; PLASMA-ENHANCED CHEMICAL VAPOUR DEPOSITION; REVERSE MICELLE; SILICON NANOWIRES; TIN NANOPARTICLES;

EID: 77957757126     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2010.08.085     Document Type: Article
Times cited : (6)

References (44)
  • 3
    • 77957775004 scopus 로고    scopus 로고
    • Nanosilicon Elsevier
    • Nanosilicon Elsevier. Oxford 2008, 5:176-216.
    • (2008) Oxford , vol.5 , pp. 176-216


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.