Microscale localization of low light emitting spots in reversed-biased silicon solar cells

Solar Energy Materials and Solar Cells

Volumn 94, Issue 12, 2010, Pages 2358-2361

  Škarvada, Pavel ^a   Tomanek ^a   Grmela, Lubomír ^a   Smith, Steve J ^b  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b SOUTH DAKOTA SCHOOL OF MINES AND TECHNOLOGY   (United States)

Author keywords

Defect; Light emission; Localization; Microscale; Scanning probe microscope; Solar cell

Indexed keywords

HIGH SPATIAL RESOLUTION; LOCALIZATION; LOW LIGHT; MICRO-SCALES; MICRON SCALE; MONOCRYSTALLINE SILICON SOLAR CELLS; NOVEL METHODS; REVERSE BIAS; SCANNING NEAR FIELD MICROSCOPY; SCANNING PROBE MICROSCOPE; SUBMICRON;

DEFECTS; LIGHT EMISSION; PROBES; SCANNING; SILICON SOLAR CELLS;

SOLAR CELLS;

EID: 77957675852     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.08.014     Document Type: Article

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