Light emission from silicon solar cells as characterization technique

2010 9th Conference on Environment and Electrical Engineering, EEEIC 2010

Volumn , Issue , 2010, Pages 97-100

  Skarvada, P ^a   Tomanek, P ^a   Koktavy, P ^a   Macku, R ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Light emission; Nondestructive characterization; Silicon solar cell

Indexed keywords

BEAM CURRENTS; CHARACTERIZATION TECHNIQUES; FORWARD BIAS; MONOCRYSTALLINE SILICON SOLAR CELLS; NONDESTRUCTIVE CHARACTERIZATION; PHOTOELECTRIC MEASUREMENTS; REVERSE BIAS VOLTAGE; VISIBLE LIGHT;

DEFECTS; ELECTRICAL ENGINEERING; ELECTROLUMINESCENCE; LIGHT; LIGHT EMISSION; SILICON SOLAR CELLS; SOLAR CELLS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77955207808     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EEEIC.2010.5490435     Document Type: Conference Paper

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