Localization and identification of microscopic defects leading to locally enhanced currents across pn-junctions of solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 633-636

  Voigt, A ^a   Goebel, T ^a   Strunk, H P ^a   Haessler, C ^a   Koch, W ^a   Karg, D ^a   Pensl, G ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; DEFECTS; ELECTRON BEAMS; INDUCED CURRENTS; ION BOMBARDMENT; MICROSCOPIC EXAMINATION; SEMICONDUCTING BORON; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS;

ELECTRON BEAM INDUCED CURRENT; MICROSCOPIC DEFECTS; OPEN CIRCUIT VOLTAGE; SELECTED MESA DIODES;

SOLAR CELLS;

EID: 0030410182     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pvsc.1996.564208     Document Type: Conference Paper

References (9)