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Volumn 97, Issue 13, 2010, Pages

Graphene and graphene oxide nanogap electrodes fabricated by atomic force microscopy nanolithography

Author keywords

[No Author keywords available]

Indexed keywords

AFM NANOLITHOGRAPHY; FUNDAMENTAL BUILDING BLOCKS; GAP WIDTHS; GRAPHENE OXIDES; NANO-DEVICES; NANOGAP ELECTRODES; RESEARCH TOOLS;

EID: 77957668694     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3493647     Document Type: Article
Times cited : (71)

References (20)
  • 2
    • 1842413643 scopus 로고    scopus 로고
    • Conductance of a molecular junction
    • DOI 10.1126/science.278.5336.252
    • M. A. Reed, C. Zhou, C. J. Muller, T. P. Burgin, and J. M. Tour, Science SCIEAS 0036-8075 278, 252 (1997). 10.1126/science.278.5336.252 (Pubitemid 27450865)
    • (1997) Science , vol.278 , Issue.5336 , pp. 252-254
    • Reed, M.A.1    Zhou, C.2    Muller, C.J.3    Burgin, T.P.4    Tour, J.M.5
  • 6
    • 33845420803 scopus 로고    scopus 로고
    • Nanoscale materials patterning and engineering by atomic force microscopy nanolithography
    • DOI 10.1016/j.mser.2006.10.001, PII S0927796X06000969
    • X. N. Xie, H. J. Chung, C. H. Sow, and A. T. S. Wee, Mater. Sci. Eng. R. MIGIEA 0927-796X 54, 1 (2006). 10.1016/j.mser.2006.10.001 (Pubitemid 44894827)
    • (2006) Materials Science and Engineering R: Reports , vol.54 , Issue.1-2 , pp. 1-48
    • Xie, X.N.1    Chung, H.J.2    Sow, C.H.3    Wee, A.T.S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.