-
3
-
-
77956761126
-
-
in edited by M. Stavola Academic Press, New York 10.1016/S0080-8784(08) 63057-4
-
K. Saarinen, P. Hautojärvi, and C. Corbel, in Identification of Defects in Semiconductors, edited by, M. Stavola, (Academic Press, New York, 1998), Vol. 51A, p. 209. 10.1016/S0080-8784(08)63057-4
-
(1998)
Identification of Defects in Semiconductors
, vol.51
, pp. 209
-
-
Saarinen, K.1
Hautojärvi, P.2
Corbel, C.3
-
4
-
-
0000098748
-
-
10.1103/PhysRevLett.79.3030;
-
K. Saarinen, Phys. Rev. Lett. 79, 3030 (1997) 10.1103/PhysRevLett.79.3030
-
(1997)
Phys. Rev. Lett.
, vol.79
, pp. 3030
-
-
Saarinen, K.1
-
5
-
-
0000403169
-
-
in Elsevier, Amsterdam, 10.1016/B978-044450630-6/50006-4;
-
K. Saarinen, in III-Nitride Semiconductors: Electrical, Structural and Defects Properties (Elsevier, Amsterdam, 2000), p. 109 10.1016/B978-044450630-6/ 50006-4
-
(2000)
III-Nitride Semiconductors: Electrical, Structural and Defects Properties
, pp. 109
-
-
Saarinen, K.1
-
6
-
-
0346135258
-
-
10.1103/PhysRevLett.90.137402;
-
S. Hautakangas, J. Oila, M. Alatalo, K. Saarinen, L. Liszkay, D. Seghier, and H. P. Gislason, Phys. Rev. Lett. 90, 137402 (2003) 10.1103/PhysRevLett.90. 137402
-
(2003)
Phys. Rev. Lett.
, vol.90
, pp. 137402
-
-
Hautakangas, S.1
Oila, J.2
Alatalo, M.3
Saarinen, K.4
Liszkay, L.5
Seghier, D.6
Gislason, H.P.7
-
7
-
-
17044424594
-
-
10.1063/1.1854745;
-
F. Tuomisto, Appl. Phys. Lett. 86, 031915 (2005) 10.1063/1.1854745
-
(2005)
Appl. Phys. Lett.
, vol.86
, pp. 031915
-
-
Tuomisto, F.1
-
8
-
-
35648965200
-
-
10.1103/PhysRevB.76.165207
-
F. Tuomisto, V. Ranki, D. C. Look, and G. C. Farlow, Phys. Rev. B 76, 165207 (2007). 10.1103/PhysRevB.76.165207
-
(2007)
Phys. Rev. B
, vol.76
, pp. 165207
-
-
Tuomisto, F.1
Ranki, V.2
Look, D.C.3
Farlow, G.C.4
-
9
-
-
33646250212
-
-
10.1103/PhysRevB.73.193301
-
S. Hautakangas, I. Makkonen, V. Ranki, M. J. Puska, K. Saarinen, X. Xu, and D. C. Look, Phys. Rev. B 73, 193301 (2006). 10.1103/PhysRevB.73.193301
-
(2006)
Phys. Rev. B
, vol.73
, pp. 193301
-
-
Hautakangas, S.1
Makkonen, I.2
Ranki, V.3
Puska, M.J.4
Saarinen, K.5
Xu, X.6
Look, D.C.7
-
10
-
-
34347330251
-
-
10.1103/PhysRevB.75.193201
-
F. Tuomisto, A. Pelli, K. M. Yu, W. Walukiewicz, and W. J. Schaff, Phys. Rev. B 75, 193201 (2007). 10.1103/PhysRevB.75.193201
-
(2007)
Phys. Rev. B
, vol.75
, pp. 193201
-
-
Tuomisto, F.1
Pelli, A.2
Yu, K.M.3
Walukiewicz, W.4
Schaff, W.J.5
-
11
-
-
33750015835
-
-
10.1038/nmat1726
-
S. F. Chichibu, Nature Mater. 5, 810 (2006). 10.1038/nmat1726
-
(2006)
Nature Mater.
, vol.5
, pp. 810
-
-
Chichibu, S.F.1
-
14
-
-
0141858877
-
-
10.1063/1.1351517
-
P. Lefebvre, Appl. Phys. Lett. 78, 1252 (2001). 10.1063/1.1351517
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 1252
-
-
Lefebvre, P.1
-
15
-
-
25744460922
-
-
10.1103/PhysRevB.50.17953
-
P. E. Blöchl, Phys. Rev. B 50, 17953 (1994). 10.1103/PhysRevB.50. 17953
-
(1994)
Phys. Rev. B
, vol.50
, pp. 17953
-
-
Blöchl, P.E.1
-
17
-
-
0011236321
-
-
10.1103/PhysRevB.59.1758
-
G. Kresse and D. Joubert, Phys. Rev. B 59, 1758 (1999). 10.1103/PhysRevB.59.1758
-
(1999)
Phys. Rev. B
, vol.59
, pp. 1758
-
-
Kresse, G.1
Joubert, D.2
-
22
-
-
77955371016
-
-
10.1103/PhysRevB.81.155301
-
X. Y. Cui, D. J. Carter, M. Fuchs, B. Delley, S. H. Wei, A. J. Freeman, and C. Stampfl, Phys. Rev. B 81, 155301 (2010). 10.1103/PhysRevB.81.155301
-
(2010)
Phys. Rev. B
, vol.81
, pp. 155301
-
-
Cui, X.Y.1
Carter, D.J.2
Fuchs, M.3
Delley, B.4
Wei, S.H.5
Freeman, A.J.6
Stampfl, C.7
-
23
-
-
0001269399
-
-
10.1103/PhysRevB.60.8849
-
V. Fiorentini, F. Bernardini, F. Della Sala, A. Di Carlo, and P. Lugli, Phys. Rev. B 60, 8849 (1999). 10.1103/PhysRevB.60.8849
-
(1999)
Phys. Rev. B
, vol.60
, pp. 8849
-
-
Fiorentini, V.1
Bernardini, F.2
Della Sala, F.3
Di Carlo, A.4
Lugli, P.5
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