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Volumn , Issue , 2010, Pages 1014-1017

GaN power switching devices

Author keywords

GaN; Gate Injection Transistor; Inverter IC; Power switching transistor

Indexed keywords

ALGAN; CONDUCTIVITY MODULATION; GAN; GATE INJECTION; HIGH BREAKDOWN VOLTAGE; HOLE INJECTION; INVERTER IC; LOW COST FABRICATION; OPERATING LOSS; OPERATING PRINCIPLES; P-TYPE; POWER DEVICES; POWER SWITCHING; POWER SWITCHING DEVICES; POWER SWITCHING TRANSISTOR; PRACTICAL USE; SI SUBSTRATES; SI-BASED; SINGLE CHIPS; STATE-OF-THE-ART DEVICES;

EID: 77956527157     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPEC.2010.5542030     Document Type: Conference Paper
Times cited : (68)

References (10)
  • 2
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    • Recent advances in GaN transistors for future emerging applications
    • M. Yanagihara, Y. Uemoto, T. Ueda, T. Tanaka, and D. Ueda, "Recent advances in GaN transistors for future emerging applications," Physica Status Solidi(a), vol. 206, 2009, pp. 1221-1227.
    • (2009) Physica Status Solidi(a) , vol.206 , pp. 1221-1227
    • Yanagihara, M.1    Uemoto, Y.2    Ueda, T.3    Tanaka, T.4    Ueda, D.5
  • 4
    • 31744436913 scopus 로고    scopus 로고
    • Recessed gate structure approach toward normally off high-voltage AlGaN/GaN HEMT for power electronics applications
    • W. Saito, Y. Takada, M. Kuraguchi, K. Tsuda, and I. Omura, "Recessed gate structure approach toward normally off high-voltage AlGaN/GaN HEMT for power electronics applications," IEEE Trans. Electron Devices, vol. 53, 2006, pp. 356-362.
    • (2006) IEEE Trans. Electron Devices , vol.53 , pp. 356-362
    • Saito, W.1    Takada, Y.2    Kuraguchi, M.3    Tsuda, K.4    Omura, I.5
  • 5
    • 33947182926 scopus 로고    scopus 로고
    • Control of threshold voltage of AlGaN/GaN HEMTs by fluoride-based plasma treatment: From depletion mode to enhancement mode
    • Y. Cai, Y. Zhou, K. M. Lau, and K. J. Chen, "Control of threshold voltage of AlGaN/GaN HEMTs by fluoride-based plasma treatment: From depletion mode to enhancement mode," IEEE Trans. Electron Devices, vol. 53, 2006, pp. 2207-2215.
    • (2006) IEEE Trans. Electron Devices , vol.53 , pp. 2207-2215
    • Cai, Y.1    Zhou, Y.2    Lau, K.M.3    Chen, K.J.4
  • 6
    • 47249146111 scopus 로고    scopus 로고
    • AlGaN/GaN recessed MIS-gate HFET with high-threshold-voltage normally-off operation for power electronics applications
    • T. Oka and T. Nozawa, "AlGaN/GaN recessed MIS-gate HFET with high-threshold-voltage normally-off operation for power electronics applications," IEEE Electron Device Lett., vol. 29, 2008, pp. 668-670.
    • (2008) IEEE Electron Device Lett. , vol.29 , pp. 668-670
    • Oka, T.1    Nozawa, T.2
  • 9
    • 77956516087 scopus 로고    scopus 로고
    • H. Umeda, T. Takizawa, Y. Anda, T. Ueda, and T. Tanaka, to be submitted
    • H. Umeda, T. Takizawa, Y. Anda, T. Ueda, and T. Tanaka, to be submitted.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.