Field emission scanning electron and atomic force microscopy, and Raman and X-ray photoelectron spectroscopy characterization of near-isogenic soft and hard wheat kernels and corresponding flours

Journal of Cereal Science

Volumn 52, Issue 2, 2010, Pages 136-142

  Scudiero, L ^a   Morris, Craig F ^a  

^a WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRITICUM AESTIVUM;

EID: 77956439423     PISSN: 07335210     EISSN: 10959963     Source Type: Journal    
DOI: 10.1016/j.jcs.2010.04.005     Document Type: Article

References (39)

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