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Volumn 268, Issue 20, 2010, Pages 3335-3339

Swift heavy ion induced structural modifications in indium oxide films

Author keywords

Electrical properties; ERDA; Indium oxide films; Swift heavy ions; X ray diffraction

Indexed keywords

ANNEALED FILMS; CLUSTER SIZES; ELASTIC RECOIL DETECTION ANALYSIS; ELECTRICAL MODIFICATION; ELECTRICAL PROPERTY; ELECTRON BEAM EVAPORATION; ERDA; FLUENCES; INDIUM OXIDE; INDIUM OXIDE FILMS; ION FLUENCES; OXYGEN LOSS; STOICHIOMETRIC FILMS; STRUCTURAL MODIFICATIONS; SWIFT HEAVY IONS; THERMAL-ANNEALING;

EID: 77956394610     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.07.009     Document Type: Article
Times cited : (17)

References (24)
  • 18
    • 77956394394 scopus 로고    scopus 로고
    • JCPDF# 851409
    • JCPDF# 851409.
  • 19
    • 77956392767 scopus 로고    scopus 로고
    • JCPDF # 760152
    • JCPDF # 760152.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.