Effects of temperature on structural and morphological features of CoPc and CoPcF16 thin films

Thin Solid Films

Volumn 518, Issue 23, 2010, Pages 7161-7166

  Schuster, Britt Elfriede ^a   Basova, Tamara V ^b   Plyashkevich, Vladimir A ^b   Peisert, Heiko ^a   Chassé, Thomas ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b NIKOLAEV INSTITUTE OF INORGANIC CHEMISTRY   (Russian Federation)

Author keywords

Atomic Force Microscopy; Metal Phthalocyanines; Morphology; Optical absorption spectroscopy; Raman spectroscopy; Thin films; X ray diffraction

Indexed keywords

COBALT PHTHALOCYANINE; DEGREE OF CRYSTALLINITY; EFFECTS OF TEMPERATURE; METAL PHTHALOCYANINES; MORPHOLOGICAL FEATURES; OPTICAL ABSORPTION SPECTROSCOPY; ORGANIC MOLECULAR BEAM DEPOSITION; SUBSTRATE TEMPERATURE; THIN FILM SYSTEMS;

ABSORPTION; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; CHEMICAL MODIFICATION; COBALT; DIFFRACTION; FILM GROWTH; LIGHT ABSORPTION; MOLECULAR ORIENTATION; MORPHOLOGY; NITROGEN COMPOUNDS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; TEMPERATURE; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 77956230018     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.06.030     Document Type: Article

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