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Oleynikov, P. http://www.analitex.com.
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51
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Simulated image maps for use in experimental high-resolution electron microscopy
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O'Keefe, M.A.; Dahmen, U.; Hetherington, CJ.D.: Simulated image maps for use in experimental high-resolution electron microscopy. Mat. Res. Soc. Symp. Proc. 159 (1989) 453-458.
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O'Keefe, M.A.1
Dahmen, U.2
Hetherington, C.J.D.3
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52
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28844509495
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A practical method to detect and correct for lens distortion in the TEM
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Capitani, G.C.; Oleynikov, P.; Hovmoller, S.; Mellini, M. A.: A practical method to detect and correct for lens distortion in the TEM. Ultramicroscopy 106 (2006) 66-74.
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(2006)
Ultramicroscopy
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Capitani, G.C.1
Oleynikov, P.2
Hovmoller, S.3
Mellini, M.A.4
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