Electron crystallography without limits? Crystal structure of Ti45Se16 redetermined by electron diffraction structure analysis

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 57, Issue 2, 2001, Pages 183-191

  Weiricht, Thomas E ^a,b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SELENIUM DERIVATIVE; TITANIUM DERIVATIVE;

ARTICLE; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; FILM; IMAGING; MOLECULAR DYNAMICS; REGRESSION ANALYSIS; RELIABILITY; STRUCTURE ANALYSIS; THICKNESS;

EID: 0035098008     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767300014070     Document Type: Article

References (6)

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6. Claffey, W. J., Priore, R. & Parsons, D. F. (1970). J. Appl. Cryst. 3, 516-519.