Structure determination of oxide compounds by electron crystallography

Micron

Volumn 32, Issue 5, 2001, Pages 473-479

  Bougerol Chaillout, C ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Direct methods; Dynamical scattering; Electron crystallography; Electron diffraction; Oxides; Patterson analysis; Structure refinement

Indexed keywords

ARTICLE;

EID: 0035144949     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(00)00056-1     Document Type: Article

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