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Volumn 17, Issue 5, 2010, Pages 606-615

Synchrotron PEEM and ToF-SIMS study of oxidized heterogeneous pentlandite, pyrrhotite and chalcopyrite

Author keywords

chalcopyrite; heterogeneity; oxidation; PEEM; pentlandite; pyrrhotite; sulfide mineral; ToF SIMS

Indexed keywords

CHALCOPYRITE; HETEROGENEITY; PEEM; PENTLANDITE; PYRRHOTITE; TOF SIMS;

EID: 77955976627     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510026749     Document Type: Article
Times cited : (32)

References (78)
  • 72
    • 0141765263 scopus 로고    scopus 로고
    • edited by J. C. Vickerman and D. Briggs. Chichester/Manchester: IM Publications
    • Vickerman, J. C. (2001). ToF-SIMS: Surface Analysis by Mass Spectrometry, edited by J. C. Vickerman and D. Briggs, pp. 1-40. Chichester/Manchester: IM Publications.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 1-40
    • Vickerman, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.