Spectroscopic and electrochemical characterization of the surface layers of chalcopyrite (CuFeS 2 ) reacted in acidic solutions

Applied Surface Science

Volumn 225, Issue 1-4, 2004, Pages 395-409

  Mikhlin, Yuri L ^a   Tomashevich, Yevgeny V ^a   Asanov, Igor P ^b   Okotrub, Alexander V ^b   Varnek, Vladimir A ^b   Vyalikh, Denis V ^c  

^a INSTITUTE OF CHEMISTRY AND CHEMICAL TECHNOLOGY   (Russian Federation)

^b NIKOLAEV INSTITUTE OF INORGANIC CHEMISTRY   (Russian Federation)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Chalcopyrite; Oxidative leaching; Voltammetry; X ray absorption spectroscopy; X ray emission; X ray photoelectron spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; CYCLIC VOLTAMMETRY; ELECTRONIC STRUCTURE; LEACHING; OXIDATION; PYRITES; SOLUTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ORBITALS; OXIDATIVE LEACHING;

SURFACE CHEMISTRY;

EID: 1342283692     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.10.030     Document Type: Article

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