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Volumn 26, Issue 12, 1998, Pages 869-871

Imaging of oxidized mineral surfaces

Author keywords

EDX; Ni, Cu; Ore; Secondary ion mass spectrometry; SIMS

Indexed keywords

BACKSCATTERING; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; ORES; OXIDATION; POLYCRYSTALLINE MATERIALS; SECONDARY ION MASS SPECTROMETRY;

EID: 0032205361     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199811)26:12<869::AID-SIA423>3.0.CO;2-R     Document Type: Article
Times cited : (5)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.