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Volumn 36, Issue 7, 2004, Pages 654-657

Photoelectron core levels for enargite, Cu3AsS4

Author keywords

As; Cu; Enargite; S; Synchrotron; XPS

Indexed keywords

ARSENIC; BINDING ENERGY; CHEMICAL BONDS; INTERFACES (MATERIALS); METALLURGY; SULFUR; SURFACE CHEMISTRY; SYNCHROTRON RADIATION; SYNCHROTRONS; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 3242723837     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1913     Document Type: Article
Times cited : (27)

References (15)
  • 14
    • 24844432580 scopus 로고
    • Springer Series in Surface Sciences: Ertl G, Go mer R, Mills DL (eds). Springer-Verlag: Berlin
    • Mönch W. In Semiconductor Surfaces and Interfaces, Springer Series in Surface Sciences: Ertl G, Go mer R, Mills DL (eds). Springer-Verlag: Berlin, 1993; 500.
    • (1993) Semiconductor Surfaces and Interfaces , pp. 500
    • Mönch, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.