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Volumn 83, Issue 4-9 SPEC. ISS., 2006, Pages 1456-1459
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AFM based polarization nanolithography on PZT sol-gel films
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Author keywords
Atomic force microscopy; Ferroelectric; Nanolithography; Sol gel
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FERROELECTRIC MATERIALS;
PIEZOELECTRICITY;
SOL-GELS;
SURFACE PROPERTIES;
THIN FILMS;
VIBRATIONS (MECHANICAL);
(PZT) THIN FILMS;
FERROELECTRIC;
MICROFABRICATED LENS ARRAY;
LITHOGRAPHY;
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EID: 33646023181
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2006.01.249 Document Type: Article |
Times cited : (7)
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References (10)
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