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Volumn 83, Issue 4-9 SPEC. ISS., 2006, Pages 1456-1459

AFM based polarization nanolithography on PZT sol-gel films

Author keywords

Atomic force microscopy; Ferroelectric; Nanolithography; Sol gel

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; PIEZOELECTRICITY; SOL-GELS; SURFACE PROPERTIES; THIN FILMS; VIBRATIONS (MECHANICAL);

EID: 33646023181     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.01.249     Document Type: Article
Times cited : (7)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.