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Volumn 56, Issue 3, 1996, Pages 239-249

Design of a novel thin-film piezoelectric accelerometer

Author keywords

Accelerometers; Piezoelectricity; Thin films

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; DAMPING; ELECTRIC FIELDS; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; POLYMERS; PYROELECTRICITY; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL EFFECTS; THIN FILM DEVICES;

EID: 0030233239     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(96)01324-6     Document Type: Article
Times cited : (127)

References (28)
  • 2
    • 0040284325 scopus 로고
    • Acoustic sensors
    • S.M. Sze (ed.), Wiley, New York
    • M.E. Motamedi and R.M. White, Acoustic sensors, in S.M. Sze (ed.), Semiconductor Sensors, Wiley, New York, 1994, pp. 97-151.
    • (1994) Semiconductor Sensors , pp. 97-151
    • Motamedi, M.E.1    White, R.M.2
  • 3
    • 0001731898 scopus 로고
    • Mechanical sensors
    • S.M. Sze (ed.), Wiley, New York
    • B. Kloeck and N.F. de Rooij, Mechanical sensors, in S.M. Sze (ed.), Semiconductor Sensors, Wiley, New York, 1994, pp. 153-204.
    • (1994) Semiconductor Sensors , pp. 153-204
    • Kloeck, B.1    De Rooij, N.F.2
  • 8
    • 84972894655 scopus 로고
    • Ferroelectric PZT thin films prepared by planar multitarget sputtering
    • R. Bruchhaus, H. Huber, D. Pitzer and W. Wersing, Ferroelectric PZT thin films prepared by planar multitarget sputtering, Integrated Ferroelectrics, 2 (1992) 157-164.
    • (1992) Integrated Ferroelectrics , vol.2 , pp. 157-164
    • Bruchhaus, R.1    Huber, H.2    Pitzer, D.3    Wersing, W.4
  • 10
    • 21544479167 scopus 로고
    • Piezoelectric properties of sol-gel derived ferroelectric and antiferroelectric thin layers
    • Jie-Fang Li, D.D. Viehland, T. Tani, C.D.E. Lakeman and D.A. Payne, Piezoelectric properties of sol-gel derived ferroelectric and antiferroelectric thin layers, J. Appl. Phys., 75 (1994) 442-448.
    • (1994) J. Appl. Phys. , vol.75 , pp. 442-448
    • Li, J.-F.1    Viehland, D.D.2    Tani, T.3    Lakeman, C.D.E.4    Payne, D.A.5
  • 12
    • 0028517627 scopus 로고
    • Orientation of rapid thermally annealed lead zirconate titanate thin films on (111) Pt substrates
    • K.G. Brooks, I.A. Reaney, R. Klissurska, Y. Huang, L. Bursill and N. Setter, Orientation of rapid thermally annealed lead zirconate titanate thin films on (111) Pt substrates, J. Mater. Res., 9 (1994) 2540-2553.
    • (1994) J. Mater. Res. , vol.9 , pp. 2540-2553
    • Brooks, K.G.1    Reaney, I.A.2    Klissurska, R.3    Huang, Y.4    Bursill, L.5    Setter, N.6
  • 13
    • 0028442219 scopus 로고
    • Use of transmission electron microscopy for the characterization of rapid thermally annealed sol-gel PZT films
    • I.M. Reaney, K.G. Brooks, R. Klissurska, Cz. Pawlaczyk and N. Setter, Use of transmission electron microscopy for the characterization of rapid thermally annealed sol-gel PZT films, J. Am. Ceram. Soc., 77 (1994) 1209-1240.
    • (1994) J. Am. Ceram. Soc. , vol.77 , pp. 1209-1240
    • Reaney, I.M.1    Brooks, K.G.2    Klissurska, R.3    Pawlaczyk, Cz.4    Setter, N.5
  • 17
    • 0002614116 scopus 로고
    • Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry
    • F.R. Blom, S. Bouwstra, M. Elwenspoek and J.H. Fluitman, Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry, J. Vac. Sci. Technol. B, 10 (1992) 19-26.
    • (1992) J. Vac. Sci. Technol. B , vol.10 , pp. 19-26
    • Blom, F.R.1    Bouwstra, S.2    Elwenspoek, M.3    Fluitman, J.H.4
  • 18
    • 0027557596 scopus 로고
    • A comparison of squeeze-film theory with measurements on a microstructure
    • M. Andrews, I. Harris and G. Turner, A comparison of squeeze-film theory with measurements on a microstructure, Sensors and Actuators A, 36 (1993) 79-87.
    • (1993) Sensors and Actuators A , vol.36 , pp. 79-87
    • Andrews, M.1    Harris, I.2    Turner, G.3
  • 28
    • 0026926287 scopus 로고
    • Measurement of piezoelectric constants using an optical heterodyne interferometer
    • D. Royer and V. Kimetik, Measurement of piezoelectric constants using an optical heterodyne interferometer, Electron. Lett., 28 (1992) 1829-1830.
    • (1992) Electron. Lett. , vol.28 , pp. 1829-1830
    • Royer, D.1    Kimetik, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.