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Volumn 527, Issue 18-19, 2010, Pages 4796-4803

Interface crack initiation due to nano-scale stress concentration

Author keywords

Crack; Initiation; Interface; Nano scale; Stress concentration; Thin film

Indexed keywords

CRACK INITIATION; INTERFACES (MATERIALS); NANOTECHNOLOGY; STRESS CONCENTRATION;

EID: 77955924974     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2010.04.002     Document Type: Article
Times cited : (42)

References (21)
  • 6
    • 0038234418 scopus 로고    scopus 로고
    • Adhesion Measurement of Films and Coatings: VSP, Netherlands
    • Buchwalter L.P. Adhesion Measurement of Films and Coatings: Vol. 2, VSP, Netherlands 2001;2:19.
    • (2001) , vol.2 , Issue.2 , pp. 19
    • Buchwalter, L.P.1
  • 18
    • 85162767427 scopus 로고
    • Tokyo Astronomical Observatory, " Rika Nenpyo" (" Science Almanac" ), Maruzen, Physical Chemistry Part,
    • Tokyo Astronomical Observatory, " Rika Nenpyo" (" Science Almanac" ), Maruzen, Physical Chemistry Part, 1979, p. 24.
    • (1979) , pp. 24


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.