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Volumn 527, Issue 18-19, 2010, Pages 4796-4803
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Interface crack initiation due to nano-scale stress concentration
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Author keywords
Crack; Initiation; Interface; Nano scale; Stress concentration; Thin film
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Indexed keywords
CRACK INITIATION;
INTERFACES (MATERIALS);
NANOTECHNOLOGY;
STRESS CONCENTRATION;
CRACKS INITIATIONS;
INITIATION;
INTERFACE CRACK INITIATIONS;
INTERFACE EDGES;
INTERFACIAL CRACKS;
MECHANICAL FACTORS;
NANO SCALE;
SCALE STRESS;
SILICON INTERFACE;
THIN-FILMS;
THIN FILMS;
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EID: 77955924974
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2010.04.002 Document Type: Article |
Times cited : (42)
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References (21)
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