Static test compaction for VLSI tests: An evolutionary approach

Advances in Electrical and Computer Engineering

Volumn 8, Issue 2, 2008, Pages 49-53

  Logofǎtu, Doina ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

Digital circuit design; Don't care value; Evolutionary algorithms; Greedy algorithm; Optimization; Set coverage problem; Test compaction problem; Test generation

Indexed keywords

EID: 77955593111     PISSN: 15827445     EISSN: None     Source Type: Journal    
DOI: 10.4316/aece.2008.02009     Document Type: Article

References (27)

1. Alon, N., Moshkovitz, D., Safra, M.: "Algorithmic construction of sets for k-restrictions," ACM Transactions on Algorithms (TALG), v. 2 n.2, pp. 153-177, 2006.
2. Cardei, M., Wu, J.: "Energy-efficient coverage problems in wireless ad-hoc sensor networks," Computer Communications, v. 29 n. 4, pp. 415-420, 2006.
3. nd Edition, MIT Press, 2001.
4. Davis, L.: "Applying adaptive algorithms to epistatic domains," In Proceedings of IJCAI, pages 162-164, 1985.
5. Davis, L.: Handbook of Genetic Algorithms, New York, 1991.
6. De Micheli, G.: Synthesis and Optimization of Digital Circuits. McGraw-Hill, Inc., 1994.
7. Drechsler, N., Drechsler, R.: Exploiting don't cares during data sequencing using genetic algorithms. In ASP Design Automation Conf., pp. 303-306, 1999.
8. Drechsler, R., Drechsler, N.: Evolutionary Algorithms for Embedded System Design. Kluwer Acadmeic Publisher, 2002.
9. Drechsler, R.: Evolutionary Algorithms for VLSI CAD. Kluwer Academic Publisher, 1998.
10. El-Maleh, A., Osais, Y.: Test vector decomposition based static compaction algorithms for combinatorial circuits, ACM Trans. Des. Autom. Electron. Syst., vol. 8, pp. 430-459, 2003.
11. Feige, U.: A Thereshold of lnn for Approximating Set Cover, Journal of the ACM (JACM), v. 45 n. 4, pp. 634-652, 1998.
12. Garey, M.R., Johnson, D.S.: Computers and Intractability - A Guide to NP-Completeness. Freeman, San Francisco, 1979.
13. Guo, R., Pomeranz, I., Reddy, S.M., On improving static test compaction for sequential circuits, VLSI Design, Fourteenth International Conference, pp. 111-116, 2001.
14. Higami, Y., Kajihara, S., Pomeranz, I., Kobayashi, S., Takamatsu, Y.: On Finding Don't Cares in Test Sequences for Sequential Circuits, IEICE Transactions on Information and Systems, v. E89 n. 11, 2006.
15. Hochbaum, D., S., Pathria, A.: Analysis of the greedy approach in problems of maximum k-coverage, Naval Research Logistics, v. 45 n.6, pp. 615-627, 1998.
16. Holland, J.H.: Adaption in Natural and Artificial Systems. The University of Michigan Press, Ann Arbor, MI, 1975.
17. Ibrahim, W., El-Chouemi, A., El-Sayed, H.: Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem, Computer Systems and Applications, IEEE International Conference, pp. 402-408, 2006.
18. Karp, M.R.: Reductibility Among Combinatorial Problems, Complexity of Computer Computations (Symposium Proceedings), Plenum Press, 1972.
19. Logofǎtu, D.: Algorithmen und Problemlösungen mit C++, Vieweg-Verlag, 2006.
20. Logofǎtu, D.: Drechsler, R., Efficient Evolutionary Approaches for the Data Ordering Problem with Inversion, 3rd European Workshop on Hardware Optimisation Techniques (EvoHOT), LNCS 3907, pp. 320-331, Budapest, 2006.
21. Logofǎtu, D.: Greedy Approaches for the Data Ordering Problem with Inversion, Proceedings of ROSYCS, Romanian Symposium on Computer Science, pp. 65-80, Iaşi, 2006.
22. Logofǎtu, D.: Algoritmi fundamentali in C++. Aplicaţii, Editura Polirom, Iaşi, 2007.
23. Logofǎtu, D.: Algoritmi fundamentali in Java. Aplicaţii, Editura Polirom, Iaşi, 2007.
24. Lund, C., Yannakakis, M.: On the hardness of approximating minimization problems, Journal of the ACM (JACM), v. 41 n. 5, pp. 960-981, 1994.
25. Mazumder, P., Rudnick, E.: Genetic Algorithms for VLSI Design, Layout & Test Automation. Prentice Hall, 1998.
26. Michalewicz, Z.: Genetic Algorithms + Data Structures = Evolution Programs, 3rd ed. Springer-Verlag, Berlin Heidelberg New York (1996).
27. Murray, A., T., Kim, K., K., Davis, J., W., Machiraju, R., Parent, R.: Coverage optimization to support security monitoring, Computers, Environment and Urban Systems, vol. 31, n. 2, pp 133-147, 2007.