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Volumn 2006, Issue , 2006, Pages 402-408
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Novel heuristic and genetic algorithms for the VLSI test coverage problem
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTATIONAL METHODS;
GENETIC ALGORITHMS;
PROBLEM SOLVING;
RESOURCE ALLOCATION;
VLSI CIRCUITS;
COMPUTING CYCLES;
TEST COVERAGE PROBLEM;
TEST-CASES;
HEURISTIC METHODS;
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EID: 33750840761
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/aiccsa.2006.205122 Document Type: Conference Paper |
Times cited : (1)
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References (12)
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