Oxygen-induced surface reconstruction of SrRuO3 and its effect on the BaTiO3 interface

ACS Nano

Volumn 4, Issue 7, 2010, Pages 4190-4196

  Shin, Junsoo ^a,b   Borisevich, Albina Y ^b   Meunier, Vincent ^b   Zhou, Jing ^c   Plummer, E Ward ^d   Kalinin, Sergei V ^b   Baddorf, Arthur P ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF WYOMING   (United States)

^d LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

epitaxial film; in situ analysis; oxide interface; oxygen engineering; surface reconstruction

Indexed keywords

ATOMIC STRUCTURE; ATOMIC-SCALE ANALYSIS; ENGINEERING SURFACES; IN-SITU; IN-SITU ANALYSIS; MULTILAYERS AND SUPERLATTICES; OXIDE INTERFACE; OXIDE INTERFACES; OXIDE STRUCTURES;

BARIUM COMPOUNDS; EPITAXIAL FILMS; EPITAXIAL GROWTH; OXYGEN; REPAIR;

SURFACE RECONSTRUCTION;

BARIUM DERIVATIVE; BARIUM TITANATE; OXIDE; OXYGEN; RUTHENIUM; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY;

BARIUM COMPOUNDS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING TUNNELING; OXIDES; OXYGEN; RUTHENIUM; SURFACE PROPERTIES; TITANIUM;

EID: 77955547784     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn1008337     Document Type: Article

References (31)

1. Junquera, J.; Ghosez, P. Critical Thickness for Ferroelectricity in Perovskite Ultrathin Films Nature 2003, 422, 506-509
2. Ahn, C. H.; Triscone, J.-M.; Mannhart, J. Electric Field Effect in Correlated Oxide Systems Nature 2004, 424, 1015-1018
3. 3 Heterointerface Nature 2004, 427, 423-426
4. Nakagawa, N.; Hwang, H. Y.; Muller, D. Why Some Interfaces Cannot Be Sharp Nat. Mater. 2006, 5, 204-209
5. Maksymovych, P.; Jesse, S.; Yu, P.; Ramesh, R.; Baddorf, A. P.; Kalinin, S. V. Polarization Control of Electron Tunneling into Ferroelectric Surfaces Science 2009, 324, 1421-1425
6. Garcia, V.; Fusil, S.; Bouzehouane, K.; Enouz-Vedrenne, S.; Mathur, N. D.; Barthélémy, A.; Bibes, M. Giant Tunnel Electroresistance for Non-destructive Readout of Ferroelectric States Nature 2009, 460, 81-84
7. Reyren, N.; Thiel, S.; Caviglia, A. D.; Kourkoutis, L. F.; Hammert, G.; Richter, C.; Schneider, C. W.; Kopp, T.; Ruetschi, A.-S.; Jaccard, D. et al. Superconducting Interfaces between Insulating Oxides Science 2007, 317, 1196-1199
8. 3 Appl. Phys. Lett. 2001, 79, 1324-1326 (Pubitemid 33599588)
9. Hoppler, J.; Stahn, J.; Niedermayer, Ch.; Malik, V. K.; Bouyanfif, H.; Drew, A. J.; Rössle, M.; Buzdin, A.; Cristiani, G.; Habermeier, H.-U. et al. Giant Superconductivity-Induced Modulation of the Frromagnetic Magnetization in a Cuprate-Manganite Superlattice Nat. Mater. 2009, 8, 315-319
10. Moore, R. G.; Zhang, J.; Nascimento, V. B.; Jin, R.; Jiandong, Guo; Wang, G. T.; Fang, Z.; Mandrus, D.; Plummer, E. W. A Surface-Tailored, Purely Electronic, Mott Metal-to-Insulator Transition Science 2007, 318, 615-619
11. 2 Surfaces: A Brief Review Appl. Phys. A: Mater. Sci. Process. 2003, 5, 681-687
12. 3 Surface Phys. Rev. Lett. 2008, 101, 036102
13. 3 Heterostructures: Origin, Dimensionality, and Perspectives Phys. Rev. Lett. 2007, 98, 216803
14. 3 Films Surf. Sci. 2005, 581, 118-132
15. 2O Nano Lett. 2009, 9, 3720-3725
16. Tagantsev, A. K.; Gerra, G.; Setter, N. Short-Range and Long-Range Contributions to the Size Effect in Metal - Ferroelectric - Metal Heterostructures Phys. Rev. B 2008, 77, 174111
17. 3 Films Studied by In Situ LEED I - V Phys. Rev. B 2008, 77, 245437
18. 3 Growth Appl. Phys. Lett. 2004, 84, 505-507
19. Plummer, E. W.; Ismail; Matzdorf, R.; Melechko, A. V.; Zhang, J. The Next 25 Years of Surface Physics Prog. Surf. Sci. 2001, 67, 17-44
20. 3 Thin Films in Vacuum J. Mater. Res. 2004, 19, 3447-3450
21. 3 Films for Studies of Scaling Effects in Ferroelectrics Appl. Phys. Lett. 2008, 93, 072902
22. 3 Ultrathin Film Capacitors Free from Passive Layers Appl. Phys. Lett. 2006, 88, 72909
23. Aguado-Puente, P.; Junquera, J. Ferromagneticlike Closure Domains in Ferroelectric Ultrathin Films: First-Principles Simulations Phys. Rev. Lett. 2008, 100, 177601
24. Gruverman, A.; Wu, D.; Lu, H.; Wang, Y.; Jang, H. W.; Folkman, C. M.; Zhuravlev, M. Ye.; Felker, D.; Rzchowski, M.; Eom, C.-B. et al. Tunneling Electroresistance Effect in Ferroelectric Tunnel Junctions at the Nanoscale Nano Lett. 2009, 9, 3539-3543
25. 3 Crystal Surface Science 1994, 266, 1540-1542
26. 3 Films by Exploiting Kinetic Limitations Appl. Phys. Lett. 2007, 91, 202901
27. Kresse, G; Hafner, G. Ab Initio Molecular Dynamics for Liquid Metals Phys. Rev. B 1993, 47, 558-561
28. Kresse, G.; Furthmuller, J. Efficient Iterative Schemes for Ab Initio Total-Energy Calculations Using a Plane-Wave Basis Set Phys. Rev. B 1996, 54, 11169-11186
29. Kresse, G.; Joubert, D. From Ultrasoft Pseudopotentials to the Projector Augmented-Wave Method Phys. Rev. B 1999, 59, 1758-1775
30. Blochl, P. E. Projector Augmented-Wave Method Phys. Rev. B 1994, 50, 17953-17979
31. Ceperley, D. M.; Alder, B. J. Ground State of the Electron Gas by a Stochastic Method Phys. Rev. Lett. 1980, 45, 566-569