Wedgelike ultrathin epitaxial BaTi O3 films for studies of scaling effects in ferroelectrics

Applied Physics Letters

Volumn 93, Issue 7, 2008, Pages

  Petraru, A ^a   Kohlstedt, H ^a   Poppe, U ^a   Waser, R ^a   Solbach, A ^b   Klemradt, U ^b   Schubert, J ^a   Zander, W ^a   Pertsev, N A ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; EPITAXIAL FILMS; FERROELECTRIC MATERIALS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; OPTICAL DESIGN; POLARIZATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING PROBE MICROSCOPY; SPUTTER DEPOSITION; SPUTTERING; SUBSTRATES; SURFACE ROUGHNESS; ULTRATHIN FILMS;

CRYSTALLINITY; ELECTRICAL MEASUREMENTS; FERROELECTRIC SIZE EFFECTS; FILM-THICKNESS; HETEROEPITAXIAL; REMANENT POLARIZATIONS; RUTHERFORD BACKSCATTERING SPECTROMETRY; SCALING EFFECTS; SRTI O3 SUBSTRATES; X-RAY DIFFRACTION;

OZONE WATER TREATMENT;

EID: 50249141671     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2972135     Document Type: Article

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