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Volumn 13, Issue 2, 2010, Pages 109-114
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Preparation and characterization of aluminum-incorporated cadmium oxide films
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Author keywords
Electrical properties; Semiconductors; X ray diffraction
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Indexed keywords
AL-CONCENTRATION;
ALTERNATIVE MATERIALS;
CADMIUM OXIDE;
CDO FILMS;
CRYSTALLINE STRUCTURE;
DISLOCATION DENSITIES;
ECONOMIC COSTS;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL PROPERTY;
ELEMENTAL ANALYSIS;
GRAIN SIZE;
HALL MEASUREMENTS;
HIGH CONDUCTIVITY;
MOBILITY VALUE;
OPTO-ELECTRONICS;
PHOTOVOLTAIC SOLAR CELLS;
PROMISING MATERIALS;
STRUCTURAL AND ELECTRICAL PROPERTIES;
STRUCTURAL PARAMETER;
TEXTURE COEFFICIENT;
ULTRASONIC SPRAY PYROLYSIS;
VAN DER PAUW;
ALUMINUM;
CADMIUM;
CADMIUM COMPOUNDS;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CHEMICAL ANALYSIS;
ELECTRIC CONDUCTIVITY;
FILM PREPARATION;
SOLAR POWER GENERATION;
SPRAY PYROLYSIS;
STRUCTURAL PROPERTIES;
ULTRASONIC TESTING;
X RAY DIFFRACTION;
X RAYS;
OXIDE FILMS;
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EID: 77955472911
PISSN: 13698001
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mssp.2010.05.006 Document Type: Article |
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Times cited : (7)
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References (30)
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