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Volumn 8, Issue 1, 1998, Pages 221-237

Fisher information matrices with censoring, truncation, and explanatory variables

Author keywords

Asymptotic variance covariance; Lognormal distribution; Regression; Reliability; Survival analysis; Test planning; Weibull distribution

Indexed keywords


EID: 0032382672     PISSN: 10170405     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (21)

References (21)
  • 1
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  • 2
    • 0000044822 scopus 로고
    • Bayesian design for accelerated life testing
    • Chaloner, K. and Larntz, K. (1992). Bayesian design for accelerated life testing. J. Statist. Plann. Inference 33, 245-259.
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  • 3
    • 0002530923 scopus 로고
    • Asymptotic distribution of linear combinations of functions of order statistics with applications to estimation
    • Chernoff, H., Gastwirth, J. L. and Johns, Jr., M. V. (1967). Asymptotic distribution of linear combinations of functions of order statistics with applications to estimation. Ann. Math. Statist. 38, 52-72.
    • (1967) Ann. Math. Statist. , vol.38 , pp. 52-72
    • Chernoff, H.1    Gastwirth, J.L.2    Johns Jr., M.V.3
  • 6
    • 0026750999 scopus 로고
    • Assessing influence in regression analysis with censored data
    • Escobar, L. A. and Meeker, W. Q. (1992). Assessing influence in regression analysis with censored data. Biometrics 48, 507-528.
    • (1992) Biometrics , vol.48 , pp. 507-528
    • Escobar, L.A.1    Meeker, W.Q.2
  • 7
    • 4243681949 scopus 로고
    • Fisher information matrix for the extreme value, normal, and logistic distributions and censored data
    • Escobar, L. A. and Meeker, W. Q. (1994). Fisher information matrix for the extreme value, normal, and logistic distributions and censored data. Appl. Statist. 43, 533-540.
    • (1994) Appl. Statist. , vol.43 , pp. 533-540
    • Escobar, L.A.1    Meeker, W.Q.2
  • 8
    • 0242389859 scopus 로고
    • Planning accelerated life test plans with two or more experimental factors
    • Escobar, L. A. and Meeker, W. Q. (1995). Planning accelerated life test plans with two or more experimental factors. Technometrics 37, 411-427.
    • (1995) Technometrics , vol.37 , pp. 411-427
    • Escobar, L.A.1    Meeker, W.Q.2
  • 9
    • 0013915076 scopus 로고
    • Iterative maximum-likelihood estimation of the parameters of normal populations from singly and doubly censored samples
    • Harter, H. L. and Moore, A. H. (1966). Iterative maximum-likelihood estimation of the parameters of normal populations from singly and doubly censored samples. Biometrika 53, 205-213.
    • (1966) Biometrika , vol.53 , pp. 205-213
    • Harter, H.L.1    Moore, A.H.2
  • 10
    • 0041019247 scopus 로고
    • Maximum-likelihood estimation, from censored samples, of the parameters of a logistic distribution
    • Harter, H. L. and Moore, A. H. (1967). Maximum-likelihood estimation, from censored samples, of the parameters of a logistic distribution. J. Amer. Statist. Assoc. 62, 675-684.
    • (1967) J. Amer. Statist. Assoc. , vol.62 , pp. 675-684
    • Harter, H.L.1    Moore, A.H.2
  • 11
    • 0009034557 scopus 로고
    • Maximum-likelihood estimation, from doubly censored samples, of the parameters of the first asymptotic distribution of extreme values
    • Harter, H. L. and Moore, A. H. (1968). Maximum-likelihood estimation, from doubly censored samples, of the parameters of the first asymptotic distribution of extreme values. J. Amer. Statist. Assoc. 63, 889-901.
    • (1968) J. Amer. Statist. Assoc. , vol.63 , pp. 889-901
    • Harter, H.L.1    Moore, A.H.2
  • 14
    • 0022912293 scopus 로고
    • Planning life tests in which units are inspected for failure
    • Meeker, W. Q. (1986). Planning life tests in which units are inspected for failure. IEEE Trans. Reliability R-35, 571-578.
    • (1986) IEEE Trans. Reliability , vol.R-35 , pp. 571-578
    • Meeker, W.Q.1
  • 15
    • 0023288393 scopus 로고
    • Limited failure population life tests: Application to integrated circuit reliability
    • Meeker, W. Q. (1987). Limited failure population life tests: Application to integrated circuit reliability. Technometrics 29, 51-65.
    • (1987) Technometrics , vol.29 , pp. 51-65
    • Meeker, W.Q.1
  • 16
    • 0026837872 scopus 로고
    • Sample sizes for estimating the weibull hazard function from censored samples
    • Meeker, W. Q., Escobar, L. A. and Hill, D. A. (1992). Sample sizes for estimating the weibull hazard function from censored samples. IEEE Trans. Reliability 41, 133-138.
    • (1992) IEEE Trans. Reliability , vol.41 , pp. 133-138
    • Meeker, W.Q.1    Escobar, L.A.2    Hill, D.A.3
  • 17
    • 0028374805 scopus 로고
    • Optimum accelerated life tests with a nonconstant scale parameter
    • Meeter, C. A. and Meeker, W. Q. (1994). Optimum accelerated life tests with a nonconstant scale parameter. Technometrics 36, 71-83.
    • (1994) Technometrics , vol.36 , pp. 71-83
    • Meeter, C.A.1    Meeker, W.Q.2
  • 20
    • 0016919169 scopus 로고
    • Theory for optimum censored accelerated life tests for normal and lognormal distributions
    • Nelson, W. and Kielpinski, T. (1976). Theory for optimum censored accelerated life tests for normal and lognormal distributions. Technometrics 18, 105-114.
    • (1976) Technometrics , vol.18 , pp. 105-114
    • Nelson, W.1    Kielpinski, T.2
  • 21
    • 0017972683 scopus 로고
    • Theory for optimum accelerated censored life tests for weibull and extreme value distributions
    • Nelson, W. and Meeker, W. Q. (1978). Theory for optimum accelerated censored life tests for weibull and extreme value distributions. Technometrics 20, 171-177.
    • (1978) Technometrics , vol.20 , pp. 171-177
    • Nelson, W.1    Meeker, W.Q.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.