X-ray spectroscopic measurement of photoelectron inelastic mean free paths in molybdenum

Journal of Physical Chemistry Letters

Volumn 1, Issue 15, 2010, Pages 2422-2427

  Chantler, Christopher T ^a   Bourke, Jay D ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE MEASUREMENT; COMPLEX MOLECULAR SYSTEMS; DIRECT MEASUREMENT; DIVERSE APPLICATIONS; ELECTRON INELASTIC MEAN FREE PATHS; ENERGY RANGES; EXPERIMENTAL DATA; INELASTIC MEAN FREE PATH; LOW-ENERGY LIMIT; NANOENVIRONMENTS; NEW APPROACHES; SPECTROSCOPIC MEASUREMENTS; STATISTICAL PRECISION; THROUGH CURRENT; X RAY ABSORPTION FINE STRUCTURES;

ELECTRON DIFFRACTION; ELECTRONS; ENERGY DISSIPATION; MOLYBDENUM; PHYSICAL CHEMISTRY; SCANNING ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77955384936     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz100776h     Document Type: Article

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