|
Volumn 619, Issue 1-3, 2010, Pages 47-50
|
An improvement to the full-foil mapping technique for high accuracy measurement of X-ray mass attenuation coefficients
|
Author keywords
Atomic form factor; X ray mass attenuation coefficient; XERT
|
Indexed keywords
MAPPING;
RADIATION;
ATOMIC FORM FACTORS;
HIGH-ACCURACY MEASUREMENTS;
MAPPING TECHNIQUES;
MASS ATTENUATION COEFFICIENTS;
UNCERTAINTY IN MEASUREMENT;
X-RAY MASS ATTENUATION;
X-RAY-EXTENDED RANGE TECHNIQUES;
XERT;
UNCERTAINTY ANALYSIS;
|
EID: 77955377510
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2010.01.067 Document Type: Conference Paper |
Times cited : (4)
|
References (16)
|