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Volumn 5, Issue 6, 2010, Pages 388-389
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Interfaces: AFM extends its reach
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Author keywords
[No Author keywords available]
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Indexed keywords
NANOTECHNOLOGY;
NANOSTRUCTURED MATERIALS;
ATOMIC FORCE MICROSCOPY;
CATALYSIS;
CONTACT ANGLE;
CRYSTALLIZATION;
ELECTRONICS;
ENERGY;
NANOANALYSIS;
PRIORITY JOURNAL;
SHORT SURVEY;
SOLID;
SOLVATION;
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EID: 77955212929
PISSN: 17483387
EISSN: 17483395
Source Type: Journal
DOI: 10.1038/nnano.2010.112 Document Type: Short Survey |
Times cited : (5)
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References (10)
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