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Volumn 13, Issue 4, 2010, Pages 42-47

Advanced testing and prognostics of ball grid array components with a stand-alone monitor IC

Author keywords

[No Author keywords available]

Indexed keywords

BALL GRID ARRAY PACKAGES; BGA PACKAGE; CONDITION-BASED MAINTENANCE; DIGITAL ELECTRONICS; FAULT COVERAGES; HEALTH MANAGEMENT; INTERCONNECT DENSITIES; INTERMITTENCY; INTERMITTENT FAULT; JOINT NETWORK; OTHER APPLICATIONS; PACKAGE DENSITY; RELIABILITY-CENTERED MAINTENANCE; SOLDER BALLS; SOLDER JOINTS; STAND -ALONE;

EID: 77955205563     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2010.5521868     Document Type: Article
Times cited : (7)

References (6)
  • 2
    • 47149084303 scopus 로고    scopus 로고
    • In-Situ, real-time detector for faults in solder joint networks belonging to operational, fully programmed field programmable gate arrays (FPGAs)
    • Aug.
    • J.P. Hofmeister, P. Lall and R. Graves, "In-Situ, Real-Time Detector for Faults In Solder Joint Networks Belonging to Operational, Fully Programmed Field Programmable Gate Arrays (FPGAs)", IEEE Instrumentation and Measurement Magazine, Aug., 2007, pp. 32-37.
    • (2007) IEEE Instrumentation and Measurement Magazine , pp. 32-37
    • Hofmeister, J.P.1    Lall, P.2    Graves, R.3
  • 3
    • 43549097875 scopus 로고    scopus 로고
    • In-Situ, real-time detector for faults in solder joints belonging to operational, fully programmed FPGAs
    • J.P. Hofmeister, P. Lall and R. Graves, "In-Situ, Real-Time Detector for Faults in Solder Joints Belonging to Operational, Fully Programmed FPGAs," in Proceedings, IEEE AUTOTESTCON 2006, 2006, pp-237-243.
    • (2006) Proceedings, IEEE AUTOTESTCON 2006 , pp. 237-243
    • Hofmeister, J.P.1    Lall, P.2    Graves, R.3
  • 6
    • 72249109593 scopus 로고    scopus 로고
    • Advanced testing and prognostics of ball grid array components with a stand-alone monitor IC
    • A. Bhatia, J.P. Hofmeister, J. Judkins, and J. Goodman, "Advanced Testing and Prognostics of Ball Grid Array Components with a Stand-alone Monitor IC," in Proc. IEEE AUTOTESTCON 2009, 2009.
    • (2009) Proc. IEEE AUTOTESTCON 2009
    • Bhatia, A.1    Hofmeister, J.P.2    Judkins, J.3    Goodman, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.