Intermittency detection and mitigation in Ball Grid Array (BGA) packages

AUTOTESTCON (Proceedings)

Volumn , Issue , 2007, Pages 40-49

  Hofmeister, James P ^a   Lall, Pradeep ^b   Walter, Thomas ^b   Goodman, Douglas ^a   Ortiz, Edgar G ^a   Adams, Mathieu G P ^a   Tracy, Terry A ^c  

^a Ridgetop Group Inc   (United States)

^b AUBURN UNIVERSITY   (United States)

^c RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATED FATIGUE DAMAGE; BALL-GRID-ARRAY PACKAGES; I/O PINS; INTEGRATED DIAGNOSTICS; INTERMITTENCY; LONG-LASTING;

BALL GRID ARRAYS; ELECTRIC CURRENTS; FATIGUE DAMAGE; FIRMWARE;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 48049117059     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2007.4374200     Document Type: Conference Paper

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