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Volumn 10, Issue 4, 2007, Pages 32-37

In-situ, real-time detector for faults in solder joint networks of operational, fully-programmed Field Programmable Gate Arrays (FPGAs)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE MANUFACTURERS; COMMERCIAL APPLICATIONS; DEFENSE CONTRACTORS; FIELD-PROGRAMMABLE GATE ARRAYS; FULLY OPERATIONAL; IN-SITU; JOINT NETWORKS; SOLDER JOINTS;

EID: 47149084303     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2007.4291220     Document Type: Article
Times cited : (7)

References (18)
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  • 2
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  • 4
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  • 5
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    • 32844459679 scopus 로고    scopus 로고
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    • Paper IPACK2005-73426, pp
    • P. Lall, N. Islam, and J. Suhling, "Leading indicators of failure for prognostication of leaded and lead-free electronics in harsh environments," in Proc. ASME InterPACK Conference, 2005, Paper IPACK2005-73426, pp. 1-9.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.