Thermal evolution of WC/C nanostructured coatings by raman and in situ XRD analysis

Plasma Processes and Polymers

Volumn 6, Issue SUPPL. 1, 2009, Pages

  El Mrabet, Said ^a,b   Abad, Manuel David ^a,b   López Cartes, Carlos ^a,b   Martínez Martínez, Diego ^a,b   Sánchez López, Juan Carlos ^a,b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

^b UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

Annealing; Nanocomposite coatings; Raman spectroscopy; Thermal stability; Tungsten carbide; X ray diffraction

Indexed keywords

CHEMICAL COMPOSITIONS; CRYSTALLINITIES; FILM MICROSTRUCTURES; IN-PHASE; IN-SITU; IN-SITU XRD; IN-VACUUM; MAGNETRON SOURCES; NANO-COMPOSITE COATING; NANOCOMPOSITE COATINGS; NANOCRYSTALLINES; NANOSTRUCTURED COATINGS; NANOSTRUCTURED FILMS; SILICON SUBSTRATES; SPUTTERING POWER; STRUCTURAL EVOLUTION; SYNTHESIS CONDITIONS; THERMAL BEHAVIOURS; THERMAL EVOLUTION; THERMAL STABILITY; X-RAY DIFFRACTION MEASUREMENTS;

AMORPHOUS CARBON; ANNEALING; COATINGS; MAGNETRONS; NANOCOMPOSITES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTRUM ANALYSIS; SPUTTERING; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; TUNGSTEN; WAVELET TRANSFORMS; X RAY DIFFRACTION; X RAYS;

TUNGSTEN CARBIDE;

EID: 77954902353     PISSN: 16128850     EISSN: 16128869     Source Type: Journal    
DOI: 10.1002/ppap.200931004     Document Type: Conference Paper

References (30)

1. A. A. Voevodin, J. P. O'Neill, S. V. Prasad, J. S. Zabinski, J. Vac. Sci. Technol. A 1999, 17, 986.
2. S. J. Park, K.-R. Lee, D.-H. Lee, K. Y. Eun, Diamond Relat. Mater. 2002, 11, 1747.
3. J.-P. Palmquist, Zs. Czigany, M. Odén, J. Neidhart, L. Hultman, U. Jansson, Thin Solid Films 2003, 444, 29.
4. C. Rebholz, J. M. Schneider, A. Leyland, A. Matthews, Surf. Coat. Technol. 1999, 112, 85.
5. K. Abdelouahdi, C. Sant, C. Legrand-Buscema, P. Aubert, J. Perrière, Ph. Renou, G. Houdy, Surf. Coat. Technol. 2006, 200, 6469.
6. J. Esteve, G. Zambrano, C. Rincon, E. Martinez, H. Galindo, P. Prieto, Thin Solid Films 2000, 373, 282.
7. A. Czyzniewski, Thin Solid Films 2003, 433, 180.
8. A. A. Voevodin, J. P. O'Neill, J. S. Zabinski, Thin Solid Films 1999, 342, 194.
9. A. A. Voevodin, J. S. Zabinski, Thin Solid Films 2000, 370, 223.
10. Y. Liu, M. Gubisch, W. Hild, M. Scherge, L. Spiess, Ch. Knedlik, J. A. Schaefer, Thin Solid Films 2005, 488, 140.
11. B. Podgornik, J. Vizintin, S. Jacobson, S. Hogmark, Surf. Coat. Technol. 2004, 177-178, 558.
12. T. A. Solzak, A. A. Polycarpou, Surf. Coat. Technol. 2006, 201, 4260.
13. S. Corradi, M. Marchetti, Fatigue Fract Eng. Mater. Struct. 2005, 28, 309.
14. C. Strondl, G. J. van der Kolk, T. Hurkmans, W. Fleischer, T. Trinh, N. M. Carvalho, J. Th, M. de Hosson, Surf. Coat. Technol. 2001, 142-144, 707.
15. M. D. Abad, J. C. Sanchez-Lopez, N. Cusnir, R. Sanjines, J. Appl. Phys. 2009, 105, 033510.
16. H. Högberg, P. Tägtström, J. Lu, U. Jansson, Thin Solid Films 1996, 272, 116.
17. N. Radic, B. Grzeta, O. Milat, J. Ivkov, M. Stubicar, Thin Solid Films 1998, 320, 192.
18. B. Trindade, M. T. Vieira, E. Bauer-Grosse, Mater. Sci. Eng. A 1994, 174, 165.
19. B. Trindade, M. T. Vieira, E. Bauer-Grosse, Acta Mater. 1998, 5, 1731.
20. S. S. Chao, D. A. Pawlik, J. Gonzalez-Hernandez, Q. Wang, D. D. Allred, Solid State Commun. 1991, 79, 205.
21. B. S. Chao, J. Gonzalez-Hernandez, A. R. Chan, J. M. Gavulic, S. R. Ovshinsky, J. L. Wood, J. Vac. Sci. Technol. A 1993, 11, 2286.
22. J. Gonzalez-Hernandez, B. S. Chao, D. A. Pawlik, D. D. Allred, Q. Wang, J. Vac. Sci. Technol. A 1992, 10, 145.
23. Z. Jiang, V. Dupuis, B. Vidal, M. F. Ravet, M. Piecuch, J. Appl. Phys. 1992, 72, 931.
24. V. Dupuis, M. F. Ravet, C. Tête, M. Piecuch, Y. Lepêtre, R. Rivora, E. Ziegler, J. Appl. Phys. 1990, 68, 5146.
25. A. S. Kurlov, A. I. Gusev, Inorg. Mater. 2006, 42, 121.
26. A. C. Ferrari, J. Robertson, Phys. Rev. B 1999, 61, 14095.
27. N. Radic, B. Pivac, F. Meinardi, Th. Koch, Mater. Sci. Eng. A 2005, 396, 290.
28. A. Baserga, V. Russo, F. Di Fonzo, A. Bailini, D. Cattaneo, C. S. Casari, A. Li Bassi, C. E. Bottani, Thin Solid Films 2007, 515, 6465.
29. B. Q. Yang, X. P. Wang, H. X. Zhang, Z. B. Wang, P. X. Feng, Mater. Lett. 2008, 62, 1547.
30. S. M. Mominuzzaman, K. M. Krishna, T. Soga, T. Jimbo, M. Umeno, Carbon 2000, 38, 127.