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Volumn 46, Issue 5, 1998, Pages 1731-1739
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Amorphous phase forming ability in (W-C)-based sputtered films
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHIZATION;
CHROMIUM;
DIFFERENTIAL THERMAL ANALYSIS;
GOLD;
MICROANALYSIS;
MOSSBAUER SPECTROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
SPUTTER DEPOSITION;
TITANIUM;
TRANSMISSION ELECTRON MICROSCOPY;
TUNGSTEN CARBIDE;
X RAY DIFFRACTION ANALYSIS;
AMORPHOUS PHASE FORMING ABILITY;
ELECTRON PROBE MICROANALYSIS (EPMA);
EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS);
METALLIC FILMS;
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EID: 0032472964
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(97)00336-4 Document Type: Article |
Times cited : (28)
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References (24)
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