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Volumn 80, Issue 24, 2009, Pages

Molecular mechanics investigations of carbon nanotube and graphene sheet interaction

Author keywords

[No Author keywords available]

Indexed keywords


EID: 77954730542     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.245421     Document Type: Article
Times cited : (22)

References (49)
  • 1
    • 0346343355 scopus 로고    scopus 로고
    • Mechanical properties of carbon nanotubes: Theoretical predictions and experimental measurements
    • DOI 10.1016/j.crhy.2003.08.001
    • R. S. Ruoff, D. Qian, and W. K. Liu, C. R. Phys. 4, 993 (2003). 10.1016/j.crhy.2003.08.001 (Pubitemid 38011997)
    • (2003) Comptes Rendus Physique , vol.4 , Issue.9 , pp. 993-1008
    • Ruoff, R.S.1    Qian, D.2    Liu, W.K.3
  • 6
    • 26444552041 scopus 로고    scopus 로고
    • Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam
    • DOI 10.1088/0957-4484/16/11/004, PII S0957448405040183
    • J. Martinez, T. D. Yuzvinsky, A. M. Fennimore, A. Z. R. Garcia, and C. Bustamante, Nanotechnology 16, 2493 (2005). 10.1088/0957-4484/16/11/004 (Pubitemid 41436762)
    • (2005) Nanotechnology , vol.16 , Issue.11 , pp. 2493-2496
    • Martinez, J.1    Yuzvinsky, T.D.2    Fennimore, A.M.3    Zettl, A.4    Garcia, R.5    Bustamante, C.6
  • 7
    • 79956008517 scopus 로고    scopus 로고
    • Single-wall carbon nanotube atomic force microscope probes
    • DOI 10.1063/1.1461073
    • E. S. Snow, P. M. Campbell, and J. P. Novak, Appl. Phys. Lett. 80, 2002 (2002). 10.1063/1.1461073 (Pubitemid 34326267)
    • (2002) Applied Physics Letters , vol.80 , Issue.11 , pp. 2002
    • Snow, E.S.1    Campbell, P.M.2    Novak, J.P.3
  • 9
    • 36149028236 scopus 로고
    • 10.1103/PhysRev.100.544
    • Y. Baskin and L. Mayer, Phys. Rev. 100, 544 (1955). 10.1103/PhysRev.100. 544
    • (1955) Phys. Rev. , vol.100 , pp. 544
    • Baskin, Y.1    Mayer, L.2
  • 18
    • 0037085825 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.65.125404
    • L. A. Girifalco and M. Hodak, Phys. Rev. B 65, 125404 (2002). 10.1103/PhysRevB.65.125404
    • (2002) Phys. Rev. B , vol.65 , pp. 125404
    • Girifalco, L.A.1    Hodak, M.2
  • 29
    • 65249115213 scopus 로고    scopus 로고
    • 10.1021/la803867w
    • A. Riemann and B. Nelson, Langmuir 25, 4522 (2009). 10.1021/la803867w
    • (2009) Langmuir , vol.25 , pp. 4522
    • Riemann, A.1    Nelson, B.2
  • 32
    • 3042988525 scopus 로고
    • 10.1021/ja00467a001
    • N. Allinger, J. Am. Chem. Soc. 99, 8127 (1977). 10.1021/ja00467a001
    • (1977) J. Am. Chem. Soc. , vol.99 , pp. 8127
    • Allinger, N.1
  • 35
    • 77954703927 scopus 로고    scopus 로고
    • NANOTUBE MODELER, Manual, JCristalSoft: 2005-2006.
    • NANOTUBE MODELER, Manual, JCristalSoft: 2005-2006.
  • 46
    • 33745908289 scopus 로고    scopus 로고
    • Interlayer forces and ultralow sliding friction in multiwalled carbon nanotubes
    • DOI 10.1103/PhysRevLett.97.025501
    • A. Kis, K. Jensen, S. Aloni, W. Mickelson, and A. Zettl, Phys. Rev. Lett. 97, 025501 (2006). 10.1103/PhysRevLett.97.025501 (Pubitemid 44050349)
    • (2006) Physical Review Letters , vol.97 , Issue.2 , pp. 025501
    • Kis, A.1    Jensen, K.2    Aloni, S.3    Mickelson, W.4    Zettl, A.5
  • 47
    • 32644442406 scopus 로고    scopus 로고
    • Self-assembled single wall carbon nanotube field effect transistors and AFM tips prepared by hot filament assisted CVD
    • DOI 10.1016/j.tsf.2005.07.218, PII S0040609005010734, Proceedings of the Third International Conference on Hot-Wire
    • L. Marty, A. Iaia, M. Faucher, V. Bouchiat, C. Naud, M. Chaumont, T. Fournier, and A. Bonnot, Thin Solid Films 501, 299 (2006). 10.1016/j.tsf.2005. 07.218 (Pubitemid 43243025)
    • (2006) Thin Solid Films , vol.501 , Issue.1-2 , pp. 299-302
    • Marty, L.1    Iaia, A.2    Faucher, M.3    Bouchiat, V.4    Naud, C.5    Chaumont, M.6    Fournier, T.7    Bonnot, A.M.8
  • 49
    • 0035442319 scopus 로고    scopus 로고
    • Carbon nanotube tip probes: Stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
    • DOI 10.1088/0957-4484/12/3/326, PII S0957448401252787, 8th Foresight Confernce on Molecular Nanotechnology
    • C. Nguyen, K. Chao, R. Stevens, D. Delzeit, A. Cassel, J. Harper, J. Han, and M. Meyyapan, Nanotechnology 12, 363 (2001). 10.1088/0957-4484/12/3/326 (Pubitemid 32962332)
    • (2001) Nanotechnology , vol.12 , Issue.3 , pp. 363-367
    • Nguyen, C.V.1    Chao, K.-J.2    Stevens, R.M.D.3    Delzeit, L.4    Cassell, A.5    Han, J.6    Meyyappan, M.7


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